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SN74ABT8652
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Product details
| Management number | 211160057 | Release Date | 2026/04/04 | List Price | $36.00 | Model Number | 211160057 | ||
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The ABT8652 scan test devices, featuring octal bus transceivers and registers, belong to the Texas Instruments SCOPE TM testability IC family. This family supports IEEE Standard 1149.1-1990 boundary scan, aiding in complex circuit-board assembly testing. Access to the test circuitry is facilitated via the 4-wire test access port (TAP) interface.
- Part of Texas Instruments' SCOPE Family: Testability Products
- Supports IEEE 1149.1-1990 (JTAG) Test Access Port & Boundary-Scan
- Normal-Function Mode: Equivalent to 'F652 and 'ABT652
- SCOPE Instruction Set
- IEEE 1149.1-1990 Mandatory Instructions, Optional INTEST, CLAMP, HIGHZ
- Inputs: Parallel-Signature Analysis with Masking Option
- Outputs: Pseudo-Random Pattern Generation
- Sample Inputs, Toggle Outputs
- Binary Count from Outputs
- Even-Parity Opcodes
- Dual Boundary-Scan Cells Per I/O for Flexibility
- EPIC-IIB BiCMOS Design: Reduced Power Dissipation
- Package Variants: Shrink Small-Outline (DL), Plastic Small-Outline (DW), Ceramic Chip Carriers (FK), Standard Ceramic DIPs (JT)
| Brand Name | Texas Instruments |
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| Manufacturer | Texas Instruments |
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